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Ëèòåðàòóðà - ÷àñòü 2


Next Generation Java Testing: TestNG and Advanced Concepts. Addison-Wesley Professional, 2007.
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  • http://www.httpunit.org.
  • http://jbehave.org/.
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  • http://easymock.org/.
  • J. Tretmans, E. Brinksma. TorX: Automated Model-Based Testing. Proc. of 1-st European Conference on Model-Driven Software Engineering, Nuremberg, Germany. pp. 31-43, December 2003.
  • http://fmt.cs.utwente.nl/tools/torx/introduction.html.
  • J.-C. Fernandez, C. Jard, T. Jeron, L. Nedelka, C. Viho. Using On-the-Fly Verification Techniques for the Generation of Test Suites. Proc of 8-th International Conference on Computer-Aided Verification, LNCS 1102:348-359, Springer, 1996.
  • http://www.inrialpes.fr/vasy/cadp/man/tgv.html.
  • F. Ambert, F. Bouquet, S. Chemin, S. Guenaud, B. Legeard, F. Peureux, N. Vacelet, M. Utting. Z-TT: A tool-set for test generation from Z and B using constraint logic programming, Proc. of Formal Approaches to Testing of Software, pp. 105-119, Brno, Czech Republic, August 2002.
  • A. Hartman, K. Nagin. TCBeans Software Test Toolkit. Proc. of 12-th International Software Quality Week, May 1999.
  • E. Farchi, A. Hartman, S. S. Pinter. Using a model-based test generator to test for standard conformance. IBM Systems Journal, 41(1):89-110, 2002.
  • http://www.conformiq.com/qtronic.php.
  • http://www.smartesting.com/index.php/cms/en/explore/products.
  • I. Bourdonov, A. Kossatchev, V. Kuliamin, A. Petrenko. UniTesK Test Suite Architecture. Proc. of FME 2002. LNCS 2391:77-88, Springer, 2002.
  • Â. Â. Êóëÿìèí, À. Ê. Ïåòðåíêî, À. Ñ. Êîñà÷åâ, È. Á. Áóðäîíîâ. Ïîäõîä UniTesK ê ðàçðàáîòêå òåñòîâ. Ïðîãðàììèðîâàíèå, 29(6):25-43, 2003.
  • http://www.unitesk.ru.
  • C. Campbell, W. Grieskamp, L. Nachmanson, W. Schulte, N. Tillmann, M. Veanes. Testing Concurrent Object-Oriented Systems with Spec Explorerþ Proc. of Formal Methods Europe, LNCS582:542-547, Springer, 2005.
  • http://research.microsoft.com/en-us/projects/SpecExplorer/.
  • http://www.cs.waikato.ac.nz/~marku/mbt/modeljunit/.
  • J. Jacky, M. Veanes, C. Campbell, W. Schulte.


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